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Jaewon Oh

Engineering Tech & Constr Mgmt
durability
photovoltaics
PV
PV performance
PV systems
reliability
renewable energy
solar cells
Related People
Christopher Bejger
Yong Zhang
Sukumar Kamalasadan
Yongge Wang
Wei Gao
Abasifreke Ebong
Electrical Engineering Technology
Assistant Professor
Smith 343
704-687-5063
Jaewon.Oh@uncc.edu
Education:
• Ph.D. Electrical Engineering, Arizona State University
• M.S. Alternative Energy Technology, Arizona State University
• B.S. Electronics Engineering, Konkuk University
 
Research Interests:
• PV reliability
• Solar cell and module characterization
• Building integrated PV
• PV system performance
 
Selected Publications:
• A. Pavgi, J. Oh, and G. Tamizhmani, “Thermally Conductive Backsheets (TCB) of PV Modules: Positive impacts on performance, lifetime and LCOE,” Energies, vol. 14, no. 5, 2021.
• A. Sinha, H. Gopalakrishna, A. Subramaniyan, D. Jain, J. Oh, D. Jordan, and G. Tamizhmani, “Prediction of climate-specific degradation rate for photovoltaic encapsulant discoloration,” IEEE Journal of Photovoltaics, vol. 10, no. 4, pp.1093-1101, 2020.
• J. Oh, B. Rammohan, A. Pavgi, S. Tatapudi, G. Tamizhmani, G. Kelly, and M. Bolen, “Reduction of PV module temperature using thermally conductive backsheets,” IEEE Journal of Photovoltaics, vol. 8, no. 5, pp. 1160-1167, 2018.
• J. Oh, B. Dauksher, S. Bowden, G. Tamizhmani, P. Hacke, and J. D’Amico, “Further studies on the effect of SiNx refractive index and emitter sheet resistance on potential-induced degradation,” IEEE Journal of Photovoltaics, vol. 7, pp. 437-443, 2017.
• J. Oh, G. Tamizhmani, S. Bowden, and S. Garner, “Surface disruption method with flexible glass to prevent potential induced degradation of the shunting type in PV modules,” IEEE Journal of Photovoltaics, vol. 7, pp. 62-67, 2017.
• J. Oh, S. Bowden, and G. Tamizhmani, “Potential induced degradation (PID): Incomplete recovery of shunt resistance and quantum efficiency losses,” IEEE Journal of Photovoltaics, vol. 5, pp. 1540-1548, 2015
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